Title :
Algorithms for automatic test-pattern generation
Author :
Kirkland, Tom ; Mercer, M. Ray
Author_Institution :
MCC, Austin, TX, USA
fDate :
6/1/1988 12:00:00 AM
Abstract :
Three well-known algorithms for the automatic test pattern generation (ATPG) for digital circuits are the D algorithm, Podem, and Fan. The author introduces the concept of test generation and analyzes the way each algorithm uses search and backtracking techniques to sensitize a fault and propagate it to an observable point. The heuristics used to guide ATPG search and the notation used to represent circuit values are examined.<>
Keywords :
automatic testing; digital integrated circuits; integrated circuit testing; logic testing; D algorithm; Fan; Podem; automatic test-pattern generation; backtracking techniques; digital circuits; test generation; Algorithm design and analysis; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit testing; Digital circuits; Electrical fault detection; Fault detection; Microelectronics; Test pattern generators;
Journal_Title :
Design & Test of Computers, IEEE
