• DocumentCode
    1251971
  • Title

    Common-Gate Load-Pull With Q-Band Application

  • Author

    Mahon, Simon J. ; Young, Alan C. ; Parker, Anthony E.

  • Author_Institution
    Sydney Design Centre, Macom Technol. Solutions, Sydney, NSW, Australia
  • Volume
    47
  • Issue
    10
  • fYear
    2012
  • Firstpage
    2282
  • Lastpage
    2290
  • Abstract
    A new technique is proposed for the design of linear power amplifiers at millimeter-wave frequencies where load-pull of large transistor output cells is difficult. The technique transforms the load-pull data on a small, standard foundry transistor layout to a pair of common-gate contours for the intrinsic device; one source-gate and one drain-gate. These are recombined as an intrinsic drain-source contour for a larger and arbitrary transistor layout. A Q-band driver amplifier for the ETSI 42-GHz point-to-point radio band has been designed using the proposed technique. The fabricated MMIC consumes 1 W and has a gain of 21 dB, with OIP3 of 35 dBm, OIP5 of 28 dBm and P1 dB of 23 dBm. The PAE is approximately 19%. The OIP3 to P1 dB and OIP3 to dc power ratios are believed to be the best reported to date.
  • Keywords
    MMIC amplifiers; power amplifiers; MMIC; Q-band application; bandwidth 42 GHz; common-gate contours; common-gate load-pull; drain-gate; gain 21 dB; intrinsic device; intrinsic drain-source contour; large transistor output cells; linear power amplifiers; load-pull data; millimeter-wave frequencies; power 1 W; source-gate; standard foundry transistor layout; Integrated circuit modeling; Layout; Logic gates; Metals; Semiconductor device measurement; Standards; Transistors; $Q$-band; Computer simulation; HEMTs; MMICs; electromagnetic analysis; gallium arsenide; integrated circuit modeling; linear amplifiers; linearity; load-pull; microwave amplifiers; microwave devices; millimeter wave integrated circuits; millimeter wave measurements; modeling; nonlinear distortion; semiconductor device modeling; simulation;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/JSSC.2012.2204913
  • Filename
    6249764