• DocumentCode
    1252141
  • Title

    Real-Time Testing Method for Multilevel Signal Interfaces and Its Impact on Test Cost

  • Author

    Ishida, Makoto ; Ichiyama, Kiyotaka ; Fujibe, T. ; Watanabe, Daisuke ; Kawabata, Michitaka

  • Volume
    29
  • Issue
    5
  • fYear
    2012
  • Firstpage
    63
  • Lastpage
    71
  • Abstract
    This paper proposes a real-time testing method for multilevel signal interfaces. It utilizes multilevel drivers that can modulate both the voltage and timing of an output signal, and multilevel comparators based on a dynamic threshold concept. The authors also consider the impact on test cost of the proposed system and compares that cost with a conventional binary test system.
  • Keywords
    comparators (circuits); driver circuits; real-time systems; timing circuits; dynamic threshold concept; multilevel comparators; multilevel drivers; multilevel signal interfaces; output signal; real-time testing; test cost; timing modulation; voltage modulation; Jitter; Noise measurement; Real time systems; Receivers; Testing; Threshold voltage; Timing; jitter tolerance; multi-level signal interface; multi-level signal testing; voltage noise tolerance;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/MDT.2012.2210382
  • Filename
    6249797
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1252141