• DocumentCode
    1252605
  • Title

    Accurate modeling and parameter extraction for MOS transistors valid up to 10 GHz

  • Author

    Jen, Steve Hung-Min ; Enz, Christian C. ; Pehlke, David R. ; Schröter, Michael ; Sheu, Bing J.

  • Author_Institution
    IC Media Corp., Santa Clara, CA, USA
  • Volume
    46
  • Issue
    11
  • fYear
    1999
  • fDate
    11/1/1999 12:00:00 AM
  • Firstpage
    2217
  • Lastpage
    2227
  • Abstract
    Accurate modeling and efficient parameter extraction of the small signal equivalent circuit of submicrometer MOS transistors for high-frequency operation are presented. The equivalent circuit is based on a quasi-static approximation which was found to be adequate in the gigahertz range if the extrinsic components are properly modeled. It includes the complete intrinsic quasi-static MOS model, the series resistances of gate, source, and drain, and a substrate coupling network. Direct extraction is performed by Y-parameter analysis on the equivalent circuit in the linear and saturation regions of operation. The extracted results are physically meaningful and can be used to “de-embed” the extrinsic effects such as the substrate coupling within the device. Good agreement has been obtained between the simulation results of the equivalent circuit and measured data up to 10 GHz
  • Keywords
    MOSFET; equivalent circuits; semiconductor device models; 10 GHz; RF MOSFET; Y-parameter analysis; de-embedding; high-frequency operation; model; parameter extraction; quasi-static approximation; small-signal equivalent circuit; submicrometer MOS transistor; substrate coupling; Circuit simulation; Coupling circuits; Equivalent circuits; Integrated circuit measurements; MOSFETs; Parameter extraction; Performance analysis; Radio frequency; Semiconductor device modeling; Substrates;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.796299
  • Filename
    796299