DocumentCode
1252605
Title
Accurate modeling and parameter extraction for MOS transistors valid up to 10 GHz
Author
Jen, Steve Hung-Min ; Enz, Christian C. ; Pehlke, David R. ; Schröter, Michael ; Sheu, Bing J.
Author_Institution
IC Media Corp., Santa Clara, CA, USA
Volume
46
Issue
11
fYear
1999
fDate
11/1/1999 12:00:00 AM
Firstpage
2217
Lastpage
2227
Abstract
Accurate modeling and efficient parameter extraction of the small signal equivalent circuit of submicrometer MOS transistors for high-frequency operation are presented. The equivalent circuit is based on a quasi-static approximation which was found to be adequate in the gigahertz range if the extrinsic components are properly modeled. It includes the complete intrinsic quasi-static MOS model, the series resistances of gate, source, and drain, and a substrate coupling network. Direct extraction is performed by Y-parameter analysis on the equivalent circuit in the linear and saturation regions of operation. The extracted results are physically meaningful and can be used to “de-embed” the extrinsic effects such as the substrate coupling within the device. Good agreement has been obtained between the simulation results of the equivalent circuit and measured data up to 10 GHz
Keywords
MOSFET; equivalent circuits; semiconductor device models; 10 GHz; RF MOSFET; Y-parameter analysis; de-embedding; high-frequency operation; model; parameter extraction; quasi-static approximation; small-signal equivalent circuit; submicrometer MOS transistor; substrate coupling; Circuit simulation; Coupling circuits; Equivalent circuits; Integrated circuit measurements; MOSFETs; Parameter extraction; Performance analysis; Radio frequency; Semiconductor device modeling; Substrates;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.796299
Filename
796299
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