Title :
Breakdown of Rod-Plane Gaps in SF6 Under Positive Switching Impulses
Author :
Anis, H. ; Srivastava, K.D.
Author_Institution :
University of Waterloo, Waterloo, Ontario, Canada
fDate :
3/1/1982 12:00:00 AM
Abstract :
Summary form only given, as follows.
Keywords :
Breakdown voltage; Cost function; Electric breakdown; Power system reliability; Propagation losses; Threshold voltage;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1982.5520310
