Title :
COSMOS-A representation scheme for 3D free-form objects
Author :
Dorai, Chitra ; Jain, Anil K.
Author_Institution :
IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
fDate :
10/1/1997 12:00:00 AM
Abstract :
We address the problem of representing and recognizing 3D free-form objects when (1) the object viewpoint is arbitrary, (2) the objects may vary in shape and complexity, and (3) no restrictive assumptions are made about the types of surfaces on the object. We assume that a range image of a scene is available, containing a view of a rigid 3D object without occlusion. We propose a new and general surface representation scheme for recognizing objects with free-form (sculpted) surfaces. In this scheme, an object is described concisely in terms of maximal surface patches of constant shape index. The maximal patches that represent the object are mapped onto the unit sphere via their orientations, and aggregated via shape spectral functions. Properties such as surface area, curvedness, and connectivity, which are required to capture local and global information, are also built into the representation. The scheme yields a meaningful and rich description useful for object recognition. A novel concept, the shape spectrum of an object is also introduced within the framework of COSMOS for object view grouping and matching. We demonstrate the generality and the effectiveness of our scheme using real range images of complex objects
Keywords :
computational complexity; image matching; image representation; object recognition; 3D free-form objects; COSMOS; complex objects; complexity; connectivity; constant shape index; curvedness; general surface representation scheme; maximal surface patches; object recognition; object view grouping; object viewpoint; range images; representation scheme; shape spectral functions; shape spectrum; surface area; Application software; Electrical capacitance tomography; Inspection; Layout; Manufacturing automation; Manufacturing industries; Object recognition; Shape; Surface texture; Virtual manufacturing;
Journal_Title :
Pattern Analysis and Machine Intelligence, IEEE Transactions on