DocumentCode :
1252684
Title :
Complex electron wave reconstruction using parameter estimation
Author :
vand den Bos, A.
Author_Institution :
Dept. of Appl. Phys., Delft Univ. of Technol.
Volume :
46
Issue :
4
fYear :
1997
fDate :
8/1/1997 12:00:00 AM
Firstpage :
826
Lastpage :
830
Abstract :
A new method is proposed for the reconstruction of the complex valued exit wave of a periodic specimen in a transmission electron microscope. The method uses a series of images recorded at different defoci. From these, inherently noisy, images the parameters defining the wave are estimated. The method keeps the number of parameters as small as possible. In addition, in simulations, it has been found to always produce the exit wave estimate fitting best to the images recorded
Keywords :
Fourier series; digital simulation; image reconstruction; maximum likelihood estimation; physics computing; simulation; transmission electron microscopy; Fourier analysis; complex electron wave reconstruction; complex valued exit wave; identification; image reconstruction; maximum likelihood; modelling; parameter estimation; periodic specimen; simulation; transmission electron microscope; wave estimate; Cameras; Electron microscopy; Helium; Image reconstruction; Maximum likelihood estimation; Parameter estimation; Periodic structures; Pixel; Transfer functions; Transmission electron microscopy;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.650782
Filename :
650782
Link To Document :
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