Title :
Statistical analysis of autoscaling feedback in mixed-signal circuits
Author :
Hejn, Konrad ; Pacut, Andrzej
Author_Institution :
Fac. of Electron. & Inf. Technol., Warsaw Univ. of Technol., Poland
fDate :
8/1/1997 12:00:00 AM
Abstract :
The paper presents theory and simulation results for a statistically based concurrent corrector for mixed-signal circuits. Its dynamics, asymptotic accuracy, and certain problems related to measurements of its meteorological parameters are analyzed in details
Keywords :
analogue-digital conversion; calibration; mixed analogue-digital integrated circuits; statistical analysis; stochastic systems; A/D conversion; asymptotic accuracy; autocalibration; autoscaling feedback; concurrent corrector; deterministic input; dither techniques; dynamics; meteorological parameters; mixed analogue digital circuits; mixed-signal circuits; random input; statistical analysis; stochastic circuits; Aging; Circuit simulation; Feedback circuits; Helium; Integrated circuit measurements; Meteorology; Mixed analog digital integrated circuits; Statistical analysis; Stochastic processes; Temperature;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
