DocumentCode :
1252811
Title :
Measurement of very-fast-voltage rise curve due to gap discharge using coupled transmission lines in distributed constant system
Author :
Kawamata, Ken ; Minegishi, Shigeki ; Haga, Akira ; Sato, Risaburo
Author_Institution :
Hachinohe Inst. of Technol., Japan
Volume :
46
Issue :
4
fYear :
1997
fDate :
8/1/1997 12:00:00 AM
Firstpage :
918
Lastpage :
921
Abstract :
A measurement method of very-fast-voltage rise curves due to gap discharge using the coupled transmission lines was examined to discuss a electromagnetic noise source from a viewpoint of electromagnetic compatibility (EMC). The measurement system consists of a distributed constant line system, because the voltage transients were very rapid. A characteristic of the gap electrode, which has a matched impedance for the distributed constant line system, was investigated in the frequency range below 5 GHz. The voltages of power source in experiment were 510 V and 800 V because the Paschen´s law holds stability in air condition. As a consequence of the experiment with this measurement system, the measurement method made it possible to observe the very fast rise curves of about 100 ps
Keywords :
characteristics measurement; discharges (electric); distribution networks; electrical contacts; electromagnetic compatibility; electromagnetic interference; power system transients; voltage measurement; 100 ps; 5 GHz; 510 V; 800 V; EMC; Paschen´s law; air condition; coupled transmission lines; distributed constant line system; distributed constant system; electromagnetic compatibility; electromagnetic noise source; gap discharge; gap electrode; matched impedance; stability; very-fast-voltage rise curve; voltage transients; Electromagnetic compatibility; Electromagnetic compatibility and interference; Electromagnetic coupling; Electromagnetic measurements; Fault location; Noise measurement; Power system transients; Power transmission lines; Transmission line measurements; Voltage;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.650800
Filename :
650800
Link To Document :
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