Title :
Optimized sinewave test of waveform digitizers by a DFT approach
Author :
Bertocco, Matteo ; Narduzzi, Claudio ; Petri, Dario
Author_Institution :
Dipt. di Elettronica e Inf., Padova Univ., Italy
fDate :
8/1/1997 12:00:00 AM
Abstract :
This paper presents a particularly simple and effective discrete Fourier transform (DFT)-based approach for digitizing waveform recorder testing. Its implementation is straightforward and signal processing requirements are confined to the calculation of the DFT, which can be carried out by a readily implemented fast Fourier transform algorithm. Adjustments to the test generator can be determined to ensure that tests are carried out under optimal conditions, providing accurate and reliable estimates of digitizer performance parameters
Keywords :
discrete Fourier transforms; electronic equipment testing; quantisation (signal); signal sampling; spectral analysers; waveform analysis; DFT; digitizer performance parameters; discrete Fourier transform; fast Fourier transform algorithm; optimized sinewave test; signal processing; test generator; waveform digitizers; waveform recorder testing; Discrete Fourier transforms; Fast Fourier transforms; Frequency estimation; Guidelines; Oscilloscopes; Parameter estimation; Quantization; Sampling methods; Signal processing algorithms; Testing;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
