DocumentCode
1252878
Title
Test of subranging A/D converters with digital correction
Author
Chiorboli, Giovanni ; Boni, Andrea ; Franco, Giovanni
Author_Institution
Parma Univ., Italy
Volume
46
Issue
4
fYear
1997
fDate
8/1/1997 12:00:00 AM
Firstpage
975
Lastpage
979
Abstract
A test methodology based on linear modeling of subranging analog-to-digital converters with digital correction is proposed. A reduced physical model of integral nonlinearity errors is obtained by the application of the ambiguity algorithm. Simulation results are provided which demonstrate that an appreciable reduction of the number of test points can be obtained, thus reducing the high costs of testing, with low prediction errors
Keywords
analogue-digital conversion; circuit analysis computing; circuit testing; error correction; fault diagnosis; A/D converters; QR factorisation; ambiguity algorithm; digital correction; fault modelling; integral nonlinearity errors; linear modeling; prediction errors; reduced physical model; subranging A/D converters; Analog-digital conversion; Clocks; Costs; Error correction; Helium; Logic devices; Logic testing; Predictive models; Production; Redundancy;
fLanguage
English
Journal_Title
Instrumentation and Measurement, IEEE Transactions on
Publisher
ieee
ISSN
0018-9456
Type
jour
DOI
10.1109/19.650811
Filename
650811
Link To Document