Title :
A new approach for estimating high-speed analog-to-digital converter error
Author :
Muginov, Galia D. ; Venetsanopoulos, Anastasios N.
Author_Institution :
Dept. of Electr. & Comput. Eng., Toronto Univ., Ont., Canada
fDate :
8/1/1997 12:00:00 AM
Abstract :
One of the most significant types of error in digital signal processing (DSP) systems working with wideband signals is the error introduced by the analog-to-digital converter (ADC). This paper investigates an accurate, simple, and low-cost method, which can be used for calibrating, testing, and quick-monitoring ADC. The proposed method analyzes the deviation of a value of the converted signal, which is similar to the ADC working signal, from its true value. The deviation represents the tested ADC error evaluated for both frequency and voltage ranges of ADC operations using statistical data processing. It gives the only necessary ADC accuracy characteristic to a user leaving the rest to the designer. Comparisons between the proposed ADC testing approach and the known techniques are provided. The errors incurred by the method are analyzed. A special source of random signal with controlled statistical parameters and its calibration technique are also described
Keywords :
analogue-digital conversion; automatic test equipment; automatic testing; calibration; circuit testing; error statistics; signal processing; calibration; deviation; digital signal processing; high-speed analog-to-digital converter error; monitoring; statistical data processing; testing; wideband signals; Analog-digital conversion; Calibration; Data processing; Digital signal processing; Frequency; Signal analysis; Signal processing; Testing; Voltage; Wideband;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on