Title :
The optical properties of porcine nasal cartilage
Author :
Madsen, Steen J. ; Chu, Eugene A. ; Wong, Brian J F
Author_Institution :
Dept. of Health Phys., Nevada Univ., Las Vegas, NV, USA
Abstract :
Optical absorption and scattering coefficients have been determined for fresh and cryopreserved porcine nasal cartilage at a wavelength of 632.8 nm. Total transmission measurements were made on thin cryopreserved and fresh specimens. Cryopreserved tissue was sectioned while frozen using a microtome. Native thin fresh specimens were obtained from cartilage tissue at the junction of the cartilagenous septum and maxillary crest. Diffuse reflectance and transmittance measurements were performed on thick tissue specimens using standard integrating sphere techniques. Monte Carlo computer simulations were performed to obtain absorption and scattering coefficients, as well as the mean cosine of the scattering angle. The optical properties of porcine nasal cartilage are characterized by low absorption and high scatter. Absorption coefficients are 0.14±0.05 and 0.17±0.07 cm-1 for cryopreserved and fresh tissue, respectively. The corresponding cryopreserved and fresh tissue scattering coefficients are 304±47 and 297±68 cm-1 . The scattered light is highly forward peaked as indicated by the mean cosine of the scattering angle; 0.973±0.005 and 0.967±0.013 for cryopreserved and fresh tissue, respectively. The results indicate that there is no statistically significant difference between the optical properties of fresh and cryopreserved porcine nasal cartilage
Keywords :
Monte Carlo methods; absorption coefficients; bio-optics; biological tissues; light scattering; physiological models; 632.8 nm; Monte Carlo computer simulations; cartilage reshaping; cartilagenous septum; cryopreserved tissue; fresh tissue; frozen tissue sections; maxillary crest; microtome; optical properties; porcine nasal cartilage; scattering angle mean cosine; standard integrating sphere techniques; thick tissue specimens; tissue optics; Absorption; Computer simulation; Light scattering; Measurement standards; Monte Carlo methods; Optical scattering; Performance evaluation; Reflectivity; Thickness measurement; Wavelength measurement;
Journal_Title :
Selected Topics in Quantum Electronics, IEEE Journal of
DOI :
10.1109/2944.796339