DocumentCode :
1252929
Title :
Time domain analysis and its practical application to the measurement of phase noise and jitter
Author :
Cosart, Lee D. ; Peregrino, Luiz ; Tambe, Atul
Author_Institution :
Hewlett-Packard Co., Santa Clara, CA, USA
Volume :
46
Issue :
4
fYear :
1997
fDate :
8/1/1997 12:00:00 AM
Firstpage :
1016
Lastpage :
1019
Abstract :
The precise determination of phase is necessary for a very large set of measurements. Traditionally, phase measurements have been made using analog phase detectors which suffer from limited accuracy and dynamic range. This paper describes how phase digitizing, which uses time domain techniques, removes these limitations. Phase digitizing is accomplished using a time interval analyzer, which measures the signal zero-crossing times. These zero-crossing times are processed to compute phase deviation, with the reference frequency specified as a numerical value or derived from the times themselves. Phase digitizing can be applied even in the presence of modulation, as the underlying clock can be reconstructed in software to fit the data. Measurements derived from this phase data such as phase noise, jitter analysis, Allan variance (AVAR), maximum time interval error (MTIE), and time deviation (TDEV) are applied to such applications as the characterization of oscillators, computer clocks, chirp radar, token ring networks, and tributaries in communication systems
Keywords :
electric noise measurement; jitter; phase modulation; phase noise; quantisation (signal); time-domain analysis; Allan variance; analog phase detectors; chirp radar; communication systems; computer clocks; jitter; jitter analysis; maximum time interval error; oscillators; phase deviation; phase noise and jitter; reference frequency; signal zero-crossing times; time deviation; time domain analysis; token ring networks; Clocks; Detectors; Dynamic range; Frequency; Phase detection; Phase measurement; Phase modulation; Signal analysis; Time domain analysis; Time measurement;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.650819
Filename :
650819
Link To Document :
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