Fast and accurate ADC testing via an enhanced sine wave fitting algorithm

Author

Giaquinto, Nicola ; Trotta, Amerigo

Author_Institution

Dept. of Electr. & Electron., Bari Univ., Italy

Volume

46

Issue

4

fYear

1997

fDate

8/1/1997 12:00:00 AM

Firstpage

1020

Lastpage

1025

Abstract

A new sine-wave fitting algorithm for A/D converters (ADC´s) testing is presented and discussed. The key feature of the algorithm is the possibility of using test signals with amplitude greater than the full-scale range of the device under test. The new technique, combined with an improved evaluation of the conversion noise via weighted mean square error, gives very accurate and repeatable estimates of the number of effective bits, which cannot be obtained by traditional methodologies. The performance of the new method is proved by means of computer simulations and experimental results as well

Keywords

IEEE standards; analogue-digital conversion; curve fitting; digital simulation; error statistics; integrated circuit testing; least mean squares methods; parameter estimation; simulation; A/D converters; ADC testing; IC testing; IEEE standard; algorithm; computer simulation; conversion noise; effective bits; error analysis; last mean square method; noise measurement; parameter estimation; performance; repeatable estimates; sine wave fitting algorithm; weighted mean square error; Analog-digital conversion; Computer simulation; Error analysis; Histograms; Integrated circuit testing; Least mean squares methods; Legged locomotion; Mean square error methods; Measurement standards; Performance evaluation;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.650820

Filename

650820