• DocumentCode
    1253450
  • Title

    Automatic state space decomposition for approximate FSM traversal based on circuit analysis

  • Author

    Cho, Hyunwoo ; Hachtel, Gary D. ; Macii, Enrico ; Poncino, Massimo ; Somenzi, Fabio

  • Volume
    15
  • Issue
    12
  • fYear
    1996
  • fDate
    12/1/1996 12:00:00 AM
  • Firstpage
    1451
  • Lastpage
    1464
  • Abstract
    Exploiting circuit structure is a key issue in the implementation of algorithms for state space decomposition when the target is approximate FSM traversal. Given the gate-level description of a sequential circuit, the information about its structure can be captured by evaluating the affinity between pairs or groups of latches. Two main factors have to be considered in carrying out the structural analysis of a sequential circuit: latch connectivity and latch correlation. The first one takes into account the mutual dependency of each memory element on the others; the second one tells us how related are the functions realized by the logic feeding each latch. In this paper we estimate the affinity of two latches by combining these two factors, and we use this measure to formulate the state space decomposition problem as a graph partitioning problem. We propose an algorithm to automatically determine “good” partitions of the latch set which induce state space decomposition, and we present approximate FSM traversal and logic optimization results for the largest ISCAS´89 sequential benchmarks
  • Keywords
    circuit CAD; circuit optimisation; finite state machines; flip-flops; logic CAD; logic partitioning; sequential circuits; state-space methods; ISCAS´89 sequential benchmarks; affinity; approximate FSM traversal; automatic state space decomposition; circuit analysis; gate-level description; good partitions; graph partitioning problem; latch connectivity; latch correlation; latches; logic optimization; sequential circuit; structural analysis; Automatic logic units; Benchmark testing; Circuit analysis; Circuit testing; Latches; Partitioning algorithms; Reachability analysis; Sequential circuits; State estimation; State-space methods;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.552079
  • Filename
    552079