DocumentCode
1253450
Title
Automatic state space decomposition for approximate FSM traversal based on circuit analysis
Author
Cho, Hyunwoo ; Hachtel, Gary D. ; Macii, Enrico ; Poncino, Massimo ; Somenzi, Fabio
Volume
15
Issue
12
fYear
1996
fDate
12/1/1996 12:00:00 AM
Firstpage
1451
Lastpage
1464
Abstract
Exploiting circuit structure is a key issue in the implementation of algorithms for state space decomposition when the target is approximate FSM traversal. Given the gate-level description of a sequential circuit, the information about its structure can be captured by evaluating the affinity between pairs or groups of latches. Two main factors have to be considered in carrying out the structural analysis of a sequential circuit: latch connectivity and latch correlation. The first one takes into account the mutual dependency of each memory element on the others; the second one tells us how related are the functions realized by the logic feeding each latch. In this paper we estimate the affinity of two latches by combining these two factors, and we use this measure to formulate the state space decomposition problem as a graph partitioning problem. We propose an algorithm to automatically determine “good” partitions of the latch set which induce state space decomposition, and we present approximate FSM traversal and logic optimization results for the largest ISCAS´89 sequential benchmarks
Keywords
circuit CAD; circuit optimisation; finite state machines; flip-flops; logic CAD; logic partitioning; sequential circuits; state-space methods; ISCAS´89 sequential benchmarks; affinity; approximate FSM traversal; automatic state space decomposition; circuit analysis; gate-level description; good partitions; graph partitioning problem; latch connectivity; latch correlation; latches; logic optimization; sequential circuit; structural analysis; Automatic logic units; Benchmark testing; Circuit analysis; Circuit testing; Latches; Partitioning algorithms; Reachability analysis; Sequential circuits; State estimation; State-space methods;
fLanguage
English
Journal_Title
Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publisher
ieee
ISSN
0278-0070
Type
jour
DOI
10.1109/43.552079
Filename
552079
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