DocumentCode :
1253780
Title :
Electro-thermo-mechanical responses of conductive adhesive materials
Author :
Hu, Kai X. ; Yeh, Chao-pin ; Wyatt, Karl W.
Author_Institution :
Appl. Simulation & Modeling Res., Motorola Inc., Schaumburg, IL, USA
Volume :
20
Issue :
4
fYear :
1997
fDate :
12/1/1997 12:00:00 AM
Firstpage :
470
Lastpage :
477
Abstract :
Micromechanics models which aim to provide an understanding of conductive adhesive materials from the level of micro-particles (less than 30 mm) are presented in this paper. The pressure-induced conducting mechanisms are investigated. A deformation analysis reveals a logarithmic pressure-resistance relationship and is capable of addressing the conducting phenomena for both rigid and deformable particle systems within a contact mechanics framework. This logarithmic relationship also provides analytical support for findings reported in the literature of conductive adhesive research. It is observed that electrical contacts are made by squashing conducting particles for a deformable particle system while the particle penetration creates a crater in metallization to make contacts for a rigid particle system. The current analysis provides simple closed-form solutions for the elastic deformation of single-particle contacts and based on the assumption that the contact forces are evenly distributed in a conductive film, the pressure-resistance responses are correlated to the particle volume fraction. The high volume fraction, while ensuring that there are a sufficient number of particles to make contacts, may limit the particle deformation due to overall increased stiffness, resulting in the increased resistance on a per particle basis. The current analysis also offers insight into design considerations whereby limited amount of deformation (low processing temperature) and sufficiently low electrical resistance are to be simultaneously satisfied. For the mechanical performance, the uniaxial nonlinear stress-strain relationship is obtained for conductive adhesive systems in terms of polymer and particle material properties. The Mori-Tanaka´s method is utilized to account for particle-particle and particle-matrix interactions. The behaviour in thermal expansion within the elasto-plastic deformation range is also obtained in a similar fashion. In all these calculations, only a very simplified finite element analysis for the problem of a particle embedded into an infinitely extended matrix material needs to be carried out
Keywords :
adhesion; conducting materials; contact resistance; elastic deformation; elastoplasticity; electromechanical effects; filled polymers; polymer films; stress-strain relations; thermal expansion; Mori-Tanaka method; conductive adhesive material; contact mechanics; deformable particle system; elastic deformation; elasto-plastic deformation; electrical contact; electro-thermo-mechanical response; finite element analysis; logarithmic pressure-resistance relationship; mechanical properties; metallization; micromechanics model; polymer matrix; rigid particle system; stiffness; thermal expansion; uniaxial nonlinear stress-strain relationship; volume fraction; Closed-form solution; Conducting materials; Conductive adhesives; Conductive films; Contact resistance; Electric resistance; Material properties; Metallization; Polymers; Temperature;
fLanguage :
English
Journal_Title :
Components, Packaging, and Manufacturing Technology, Part A, IEEE Transactions on
Publisher :
ieee
ISSN :
1070-9886
Type :
jour
DOI :
10.1109/95.650937
Filename :
650937
Link To Document :
بازگشت