DocumentCode :
1253785
Title :
Attributed scattering centers for SAR ATR
Author :
Potter, Lee C. ; Moses, Randolph L.
Author_Institution :
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
Volume :
6
Issue :
1
fYear :
1997
fDate :
1/1/1997 12:00:00 AM
Firstpage :
79
Lastpage :
91
Abstract :
High-frequency radar measurements of man-made targets are dominated by returns from isolated scattering centers, such as corners and flat plates. Characterizing the features of these scattering centers provides a parsimonious, physically relevant signal representation for use in automatic target recognition (ATR). In this paper, we present a framework for feature extraction predicated on parametric models for the radar returns. The models are motivated by the scattering behaviour predicted by the geometrical theory of diffraction. For each scattering center, statistically robust estimation of model parameters provides high-resolution attributes including location, geometry, and polarization response. We present statistical analysis of the scattering model to describe feature uncertainty, and we provide a least-squares algorithm for feature estimation. We survey existing algorithms for simplified models, and derive bounds for the error incurred in adopting the simplified models. A model order selection algorithm is given, and an M-ary generalized likelihood ratio test is given for classifying polarimetric responses in spherically invariant random clutter
Keywords :
electromagnetic wave scattering; feature extraction; geometrical theory of diffraction; image resolution; least squares approximations; maximum likelihood estimation; radar cross-sections; radar imaging; radar target recognition; synthetic aperture radar; M-ary generalized likelihood ratio test; SAR ATR; attributed scattering centers; automatic target recognition; corners; feature estimation; feature extraction; feature uncertainty; flat plates; geometrical theory of diffraction; geometry; high-frequency radar measurements; least-squares algorithm; location; man-made targets; model order selection algorithm; parametric models; polarization response; radar returns; scattering behaviour; signal representation; statistically robust estimation; Feature extraction; Parametric statistics; Physical theory of diffraction; Predictive models; Radar measurements; Radar scattering; Scattering parameters; Signal representations; Solid modeling; Target recognition;
fLanguage :
English
Journal_Title :
Image Processing, IEEE Transactions on
Publisher :
ieee
ISSN :
1057-7149
Type :
jour
DOI :
10.1109/83.552098
Filename :
552098
Link To Document :
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