• DocumentCode
    1253839
  • Title

    The analysis of the withdrawal force curve of the wetting balance curve

  • Author

    Park, Jae Yong ; Jung, Jae Pil ; Kang, Choon Sik

  • Author_Institution
    Sch. of Mater. Sci. & Eng., Seoul Nat. Univ., South Korea
  • Volume
    22
  • Issue
    3
  • fYear
    1999
  • fDate
    9/1/1999 12:00:00 AM
  • Firstpage
    372
  • Lastpage
    377
  • Abstract
    In order to evaluate the withdrawal force curve that is shown in a typical wetting balance curve, a number of wetting balance tests were conducted in this study using Sn-37%Pb solder and copper plate samples whose shapes and immersion depths were varied for the purpose of this study. In the shape-effect experiment using vertical copper plate samples whose bottom corners were cut out in rectangles, a new step-like section appeared in the downfall segment of the wetting balance curve. According to the depth-effect experiment, the amount of time needed for the curve to reach the pinnacle of the withdrawal force curve increased in proportion to the immersion depths of the plates while the span of time taken for the drop of the curve was not affected by the depth. The decrease of the maximum measured force under the condition of a deeper immersion depth is attributable to the buoyancy force that also increases as the immersion depth gets deeper. It can be concluded from the results that: 1) the ascending profile of the withdrawal force curve in the typical force-time curve represents the sliding of solder on plates; 2) the highest point on the withdrawal force curve stands for the state in which the sliding solder meets the bottom corners of a normal vertical plate
  • Keywords
    lead alloys; soldering; tin alloys; wetting; Cu; Sn-Pb; Sn-Pb solder; buoyancy force; copper plate; immersion depth effect; shape effect; wetting balance curve; withdrawal force curve; Copper; Electronic components; Electronic equipment testing; Force measurement; Materials science and technology; Packaging; Performance evaluation; Shape; Software packages; Software testing;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/6144.796538
  • Filename
    796538