Title :
Monolithically integrated optical interferometer for refractometry
Author :
Maisenholder, B. ; Zappe, H.P. ; Moser, Michael ; Riel, P. ; Kunz, R.E. ; Edlinger, J.
Author_Institution :
Paul Scherrer Inst., Villigen
fDate :
5/22/1997 12:00:00 AM
Abstract :
A monolithically integrated optical sensor chip for measurement of analyte refractive index changes has been demonstrated. The 5×0.15 mm2 GaAs/AlGaAs-based integrated optical circuit consists of a Mach-Zender interferometer with an integrated DBR laser, a waveguide detector and a dielectric waveguide sensor pad embedded in one interferometer arm
Keywords :
III-V semiconductors; Mach-Zehnder interferometers; aluminium compounds; gallium arsenide; integrated optics; optical sensors; refractive index measurement; DBR laser; GaAs-AlGaAs; GaAs/AlGaAs integrated optical circuit; Mach-Zender interferometer; analyte refractive index measurement; dielectric waveguide sensor pad; monolithically integrated optical interferometer; optical sensor chip; refractometry; waveguide detector;
Journal_Title :
Electronics Letters
DOI :
10.1049/el:19970617
