Title :
Radar target classification and interpretation by means of structural descriptions of backscatter signals
Author :
Silverstein, Paul B. ; Sands, O. Scott ; Garber, Fred D.
Author_Institution :
Dept. of Electr. Eng., Ohio State Univ., Columbus, OH, USA
fDate :
5/1/1991 12:00:00 AM
Abstract :
An approach to radar target classification that exploits the relationship between the physical structure of the observed target and the down-range (polarimetric) cross section of the measured backscatter response is presented. The term ´structure´ refers to parameters such as the relative range between down-range scattering centers, their relative size, and, when polarization-diverse measurements are available, their relative polarimetric characteristics, including ellipticity and tilt angle. The radar backscatter signal measurements are presented as a set of down-range scattering centers parameterized by a Prony modeling technique. The relative range, size, and polarimetric shape of the resulting parameteric centers are used to describe the structure of the target. These structural descriptions of the measured backscatter signal are used to classify the target. This investigation is prompted by practical scenarios in which the characteristics of the measured signal may be significantly altered by an addition to or deletion from the standard target operating configuration. In these cases, the present approach can localize the effect of such a change and minimize its effects on the classification or interpretation of the target.<>
Keywords :
backscatter; pattern recognition; polarimetry; radar theory; signal detection; Prony modeling; backscatter signals; down-range scattering centers; ellipticity; measured backscatter response; polarimetric characteristics; polarization-diverse measurements; radar target classification; tilt angle; Backscatter; Measurement standards; Polarization; Radar cross section; Radar measurements; Radar polarimetry; Radar scattering; Scattering parameters; Shape; Size measurement;
Journal_Title :
Aerospace and Electronic Systems Magazine, IEEE