DocumentCode :
1254024
Title :
Efficient power combining with D-band (110-170 GHz) InP Gunn devices in fundamental-mode operation
Author :
Eisele, Heribert ; Haddad, George I.
Author_Institution :
Solid State Electron. Lab., Michigan Univ., Ann Arbor, MI, USA
Volume :
8
Issue :
1
fYear :
1998
fDate :
1/1/1998 12:00:00 AM
Firstpage :
24
Lastpage :
26
Abstract :
D-band InP Gunn devices on diamond heat sinks with an n+n-n+ structure and a graded doping profile in the active region were tested as free-running oscillators in individual resonant-cap full-height waveguide cavities. Subsequently, matched oscillators were power-combined in an in-line dual-cavity configuration. Combined radio frequency (RF) power levels of more than 300 mW at 106 GHz, 130 mW at 136 GHz, and more than 100 mW at 152 GHz were achieved. These RF power levels are the highest reported to date from either single or power-combined Gunn devices at W-band and D-band frequencies. They correspond to combining efficiencies of more than 80%, 86%, and more than 100% as well as overall DC-to-RF conversion efficiencies of 1.95%, 1.25%, and 0.90%, respectively. Similar to oscillators with single devices, these power-combined Gunn device oscillators exhibit good tunability and a phase noise of well below -100 dBc/Hz, measured at a frequency off the carrier of 500 kHz
Keywords :
Gunn oscillators; III-V semiconductors; cavity resonators; circuit tuning; doping profiles; indium compounds; millimetre wave oscillators; phase noise; power combiners; 0.9 to 1.95 percent; 100 to 300 mW; 106 to 152 GHz; 80 to 100 percent; D-band; EHF; InP; InP Gunn devices; MM-wave operation; W-band; diamond heat sinks; efficient power combining; free-running oscillators; fundamental-mode operation; graded doping profile; in-line dual-cavity configuration; matched oscillators; n+n-n+ structure; phase noise; power-combined Gunn device oscillators; resonant-cap full-height waveguide cavities; tunability; Cogeneration; Doping profiles; Gunn devices; Heat sinks; Indium phosphide; Oscillators; Phase noise; Radio frequency; Resonance; Testing;
fLanguage :
English
Journal_Title :
Microwave and Guided Wave Letters, IEEE
Publisher :
ieee
ISSN :
1051-8207
Type :
jour
DOI :
10.1109/75.650977
Filename :
650977
Link To Document :
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