Title :
Finding fault with deep-submicron ICs
Author :
Vallett, David P. ; Soden, Jerry M.
Author_Institution :
IBM Microelectron. Div., Essex Junction, VT, USA
fDate :
10/1/1997 12:00:00 AM
Abstract :
The ability to isolate and identify subtle defects on complex chips is threatened as semiconductor technology approaches the tenth-micron realm
Keywords :
failure analysis; fault diagnosis; integrated circuit testing; deep-submicron IC chip; failure analysis; fault diagnosis; semiconductor technology; Circuit analysis; Circuit faults; Delay; Failure analysis; Integrated circuit interconnections; Laboratories; Logic testing; Packaging; Silicon; Wiring;
Journal_Title :
Spectrum, IEEE
