• DocumentCode
    1254047
  • Title

    Automatic testing of metallized ceramic-polyimide (MCP) substrates

  • Author

    DeFoster, Steven ; Mancini, Martin ; Zalesinski, Jerzy

  • Author_Institution
    IBM Corp., Endicott, NY, USA
  • Volume
    13
  • Issue
    4
  • fYear
    1990
  • fDate
    12/1/1990 12:00:00 AM
  • Firstpage
    822
  • Lastpage
    827
  • Abstract
    The automatic testing and handling of MCP substrates at IBM is discussed. After a brief description of the product and the manufacturing processes, the challenges of testing the product, the defect mechanisms, automatic product handling, the test electronics, computer control, and alternative ways to contact the part are discussed. Every substrate is electrically tested twice. It is tested once after all of the photolithographic and wet processes, but before pinning and tinning (midline test) and once before it is put to stock (end-of-line test). The handler and electronics of the end-of-line tester are discussed. The mid-line tester is in many ways similar to the end-of-line tester. The differences between mid-line and end-of-line testing are briefly outlined
  • Keywords
    automatic test equipment; packaging; polymer films; substrates; thin film circuits; IBM; MCP substrates; PGAs; alternative ways to contact; automatic product handling; automatic testing; computer control; defect mechanisms; electrically tested twice; end-of-line tester; metallized ceramic polyimide substrates; mid-line tester; pin-grid-arrays; test electronics; Automatic testing; Circuit testing; Contacts; Dielectric thin films; Electronic equipment testing; Manufacturing processes; Metallization; Polyimides; Resists; Substrates;
  • fLanguage
    English
  • Journal_Title
    Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0148-6411
  • Type

    jour

  • DOI
    10.1109/33.62525
  • Filename
    62525