DocumentCode
1254047
Title
Automatic testing of metallized ceramic-polyimide (MCP) substrates
Author
DeFoster, Steven ; Mancini, Martin ; Zalesinski, Jerzy
Author_Institution
IBM Corp., Endicott, NY, USA
Volume
13
Issue
4
fYear
1990
fDate
12/1/1990 12:00:00 AM
Firstpage
822
Lastpage
827
Abstract
The automatic testing and handling of MCP substrates at IBM is discussed. After a brief description of the product and the manufacturing processes, the challenges of testing the product, the defect mechanisms, automatic product handling, the test electronics, computer control, and alternative ways to contact the part are discussed. Every substrate is electrically tested twice. It is tested once after all of the photolithographic and wet processes, but before pinning and tinning (midline test) and once before it is put to stock (end-of-line test). The handler and electronics of the end-of-line tester are discussed. The mid-line tester is in many ways similar to the end-of-line tester. The differences between mid-line and end-of-line testing are briefly outlined
Keywords
automatic test equipment; packaging; polymer films; substrates; thin film circuits; IBM; MCP substrates; PGAs; alternative ways to contact; automatic product handling; automatic testing; computer control; defect mechanisms; electrically tested twice; end-of-line tester; metallized ceramic polyimide substrates; mid-line tester; pin-grid-arrays; test electronics; Automatic testing; Circuit testing; Contacts; Dielectric thin films; Electronic equipment testing; Manufacturing processes; Metallization; Polyimides; Resists; Substrates;
fLanguage
English
Journal_Title
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher
ieee
ISSN
0148-6411
Type
jour
DOI
10.1109/33.62525
Filename
62525
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