Title :
Diagramming Minus the Gruntwork
Author_Institution :
Mitel Semiconductor in Ottawa, Canada
fDate :
6/1/1997 12:00:00 AM
Keywords :
Data analysis; Ducts; Engineering drawings; Equations; Graphics; Industrial control; Intelligent sensors; Mars; Shape control; Thermal sensors;
Journal_Title :
Spectrum, IEEE
DOI :
10.1109/MSPEC.1997.591667
