DocumentCode
1254511
Title
A method to predict an average activation energy for subassemblies
Author
Seager, J.D. ; Fieselman, C.D.
Author_Institution
IBM, Charlotte, NC, USA
Volume
37
Issue
5
fYear
1988
fDate
12/1/1988 12:00:00 AM
Firstpage
458
Lastpage
461
Abstract
The problem of predicting an average acceleration effect under the Arrhenius model of a subassembly with known operating and stress conditions is addressed. The average effect includes the several failure mechanisms that can exist along with the several stress conditions across the product associated with unique temperature profiles. The averaging effect is modeled by predicting an average activation energy. An example is included to demonstrate the ease of the computation
Keywords
electronic equipment testing; failure analysis; life testing; reliability; Arrhenius model; average acceleration effect; average activation energy; failure mechanisms; reliability; stress conditions; subassembly; Acceleration; Capacitors; Electronic components; Electronic equipment testing; Failure analysis; Kelvin; Life estimation; Predictive models; Stress; Temperature;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/24.9861
Filename
9861
Link To Document