Title :
Power Semiconductor Devices for Hybrid Breakers
Author :
Holroyd, F.W. ; Temple, V.A.K.
Author_Institution :
General Electric Company, Corporate Research and Development, Schenectady, NY
fDate :
7/1/1982 12:00:00 AM
Keywords :
Circuit breakers; Circuit faults; Electrodes; Fault currents; Fault detection; Power semiconductor devices; Semiconductor devices; Stress; Surges; Switches;
Journal_Title :
Power Engineering Review, IEEE
DOI :
10.1109/MPER.1982.5521088
