DocumentCode :
1254618
Title :
A 4-ns 4K×1-bit two-port BiCMOS SRAM
Author :
Yang, Tsen-Shau ; Horowitz, Mark A. ; Wooley, Bruce A.
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., CA, USA
Volume :
23
Issue :
5
fYear :
1988
fDate :
10/1/1988 12:00:00 AM
Firstpage :
1030
Lastpage :
1040
Abstract :
The authors introduce a two-port BiCMOS static random-access memory (SRAM) cell that combines ECL-level word-line voltage swings and emitter-follower bit-line coupling with a static CMOS latch for data storage. With this cell, referred to as a CMOS storage emitter access cell, it is possible to achieve access times comparable to those of high-speed bipolar SRAMs while preserving the high density and low power of CMOS memory arrays. The memory can be read and written simultaneously and is therefore well-suited to applications such as high-speed caches and video memories. A read access time of 3.8 ns at a power dissipation of 520 mW has been achieved in an experimental 4K×1-bit two-port memory integrated in a 1.5-μm 5-GHz BiCMOS technology. The access time in this prototype design is nearly temperature-insensitive, increasing to only 4 ns at a case temperature of 100°C
Keywords :
BIMOS integrated circuits; integrated memory circuits; random-access storage; 1.5 micron; 3.8 to 4 ns; 4 kbit; 5 GHz; 520 mW; BiCMOS SRAM; CMOS storage emitter access cell; ECL-level word-line voltage swings; emitter-follower bit-line coupling; high density; high-speed caches; low power; power dissipation; read access time; static CMOS latch; static RAM; static random-access memory; two-port memory; video memories; Application specific integrated circuits; BiCMOS integrated circuits; CMOS technology; High speed integrated circuits; Latches; Power dissipation; Random access memory; Read-write memory; Temperature; Voltage;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/4.5921
Filename :
5921
Link To Document :
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