Title :
Silicone die bond adhesive and clean in-line cure for copper lead frame
Author :
Suzuki, Kazunari ; Higashino, Tomoko ; Tsubosaki, Kunihiro ; Kabashima, Akira ; Mine, Katsutoshi ; Nakayoshi, Kazumi
Author_Institution :
Hitachi Microcomput. Eng. Ltd., Tokyo, Japan
fDate :
12/1/1990 12:00:00 AM
Abstract :
Stress analysis by the finite-element method and a die bonding experiment were performed indicating that a die bond adhesive having a very low Young´s modulus is effective in reducing thermal stress. A silicone elastomer adhesive and an in-line cure process named the clean cure process were developed. In this process, the adhesive is cured quickly on a heat column, thus volatile organic species which affect the yield and reliability of devices are reduced significantly during cure. The bonding of large silicon dice to copper lead frames was successfully performed using this technology
Keywords :
VLSI; finite element analysis; microassembling; packaging; silicones; stress analysis; thermal stresses; Cu lead frame; clean cure process; die bond adhesive; die bonding experiment; finite-element method; heat column; in-line cure process; large Si die bonding; low Young´s modulus adhesive; silicone elastomer adhesive; stressfree die bonding process; thermal stress reduction; Bonding; Copper; Delamination; Electronic packaging thermal management; Plastics; Silicon; Surface resistance; Thermal expansion; Thermal resistance; Thermal stresses;
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on