• DocumentCode
    1255194
  • Title

    Conventional and knowledge based approaches in fault diagnosis and supply restoration for power network

  • Author

    Teo, C.Y.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
  • Volume
    13
  • Issue
    1
  • fYear
    1998
  • fDate
    2/1/1998 12:00:00 AM
  • Firstpage
    8
  • Lastpage
    14
  • Abstract
    A versatile distribution system simulator integrating load flow, fault current calculation and modeling of overcurrent relays and breaker operation is described. Appropriate sets of scenarios are generated for different levels of exercise and all actions taken by the students are logged, evaluated and awarded a grade. The simulator is then configured to link to a knowledge based system and the students can attempt to diagnose faults and restore supply using a knowledge base approach. Through a series of hands-on exercises, the students strengthen their understanding of generic diagnostic rules, restoration algorithms, knowledge acquisition and inference mechanism
  • Keywords
    computer aided instruction; digital simulation; distribution networks; fault currents; inference mechanisms; knowledge acquisition; knowledge based systems; load flow; overcurrent protection; power engineering education; power system analysis computing; power system protection; power system restoration; relay protection; breaker operation; distribution system simulator; fault current calculation; fault diagnosis; faults diagnosis; generic diagnostic rules; hands-on exercises; inference mechanism; knowledge acquisition; knowledge based approach; load flow; overcurrent relays modeling; power network; restoration algorithms; supply restoration; Circuit faults; Fault currents; Fault diagnosis; Knowledge based systems; Load flow; Power supplies; Power system modeling; Power system relaying; Power system restoration; Power system simulation;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/59.651606
  • Filename
    651606