DocumentCode :
1255452
Title :
Corrosion criteria for electronic packaging. II. Calculated corrosion currents and acceleration factors
Author :
Hoge, Carl E.
Author_Institution :
Western Digital Corp., Irvine, CA, USA
Volume :
13
Issue :
4
fYear :
1990
fDate :
12/1/1990 12:00:00 AM
Firstpage :
1098
Lastpage :
1104
Abstract :
For pt.I see ibid., p.1090-7, Dec. 1990. Numerical values for corrosion currents are calculated for the parameters cited in Part I. A comparison of relative corrosion currents flowing under test and operating conditions is presented. Ratios of these currents are calculated to identify acceleration factors for several ambients. Data reveal that under certain conditions, net deacceleration can result for devices having junction temperatures that are above test condition temperatures. Net accelerations from test to test are shown to be constant as long as the activation energy for the process remains unchanged
Keywords :
corrosion; integrated circuit technology; integrated circuit testing; life testing; metallisation; packaging; accelerated testing; acceleration factors; activation energy; corrosion currents; junction temperatures; net deacceleration; test condition temperatures; Acceleration; Atomic layer deposition; Atomic measurements; Corrosion; Electronics packaging; Equations; Kinetic theory; Life estimation; Materials testing; Temperature;
fLanguage :
English
Journal_Title :
Components, Hybrids, and Manufacturing Technology, IEEE Transactions on
Publisher :
ieee
ISSN :
0148-6411
Type :
jour
DOI :
10.1109/33.62554
Filename :
62554
Link To Document :
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