• DocumentCode
    1255529
  • Title

    Expose yourself to automated test equipment [From the Editor´s Bench]

  • Author

    Engelberg, Shlomo

  • Volume
    13
  • Issue
    4
  • fYear
    2010
  • fDate
    8/1/2010 12:00:00 AM
  • Firstpage
    4
  • Lastpage
    4
  • Abstract
    At this time each year, we publish the AUTOTESTCON issue. In this issue, we cover the 45th edition of AUTOTESTCON which was held in Anaheim, California from September 14 ߝ 17, 2009.
  • fLanguage
    English
  • Journal_Title
    Instrumentation & Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/MIM.2010.5521855
  • Filename
    5521855
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1255529