• DocumentCode
    1255565
  • Title

    Instrument design that solves the challenges of both legacy and emerging test requirements

  • Author

    Heide, Carl ; Kaushansky, David

  • Author_Institution
    Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
  • Volume
    13
  • Issue
    4
  • fYear
    2010
  • fDate
    8/1/2010 12:00:00 AM
  • Firstpage
    22
  • Lastpage
    27
  • Abstract
    When most people think of advanced technology and electronics they immediately think of rapid change, rapid replacement and short lifetimes. In the commercial market, product duration and support lifetimes tend to be measured in months to a few years. By comparison, reliability and supportability across many years and even a couple of decades is common for military and aerospace technology applications.
  • Keywords
    test equipment; instrument design; reliability; supportability; test requirements; Aerospace testing; Automatic testing; Consumer electronics; Costs; Electronic equipment testing; Instruments; Investments; Life testing; Manufacturing; System testing;
  • fLanguage
    English
  • Journal_Title
    Instrumentation & Measurement Magazine, IEEE
  • Publisher
    ieee
  • ISSN
    1094-6969
  • Type

    jour

  • DOI
    10.1109/MIM.2010.5521862
  • Filename
    5521862
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1255565