DocumentCode :
1255565
Title :
Instrument design that solves the challenges of both legacy and emerging test requirements
Author :
Heide, Carl ; Kaushansky, David
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
Volume :
13
Issue :
4
fYear :
2010
fDate :
8/1/2010 12:00:00 AM
Firstpage :
22
Lastpage :
27
Abstract :
When most people think of advanced technology and electronics they immediately think of rapid change, rapid replacement and short lifetimes. In the commercial market, product duration and support lifetimes tend to be measured in months to a few years. By comparison, reliability and supportability across many years and even a couple of decades is common for military and aerospace technology applications.
Keywords :
test equipment; instrument design; reliability; supportability; test requirements; Aerospace testing; Automatic testing; Consumer electronics; Costs; Electronic equipment testing; Instruments; Investments; Life testing; Manufacturing; System testing;
fLanguage :
English
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
Publisher :
ieee
ISSN :
1094-6969
Type :
jour
DOI :
10.1109/MIM.2010.5521862
Filename :
5521862
Link To Document :
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