Title :
Instrument design that solves the challenges of both legacy and emerging test requirements
Author :
Heide, Carl ; Kaushansky, David
Author_Institution :
Dept. of Electr. Eng., Stanford Univ., Stanford, CA, USA
fDate :
8/1/2010 12:00:00 AM
Abstract :
When most people think of advanced technology and electronics they immediately think of rapid change, rapid replacement and short lifetimes. In the commercial market, product duration and support lifetimes tend to be measured in months to a few years. By comparison, reliability and supportability across many years and even a couple of decades is common for military and aerospace technology applications.
Keywords :
test equipment; instrument design; reliability; supportability; test requirements; Aerospace testing; Automatic testing; Consumer electronics; Costs; Electronic equipment testing; Instruments; Investments; Life testing; Manufacturing; System testing;
Journal_Title :
Instrumentation & Measurement Magazine, IEEE
DOI :
10.1109/MIM.2010.5521862