• DocumentCode
    1255775
  • Title

    Test research in Japan

  • Author

    Fujiwara, Hideo ; Takamatsu, Yuzo ; Nanya, Takashi ; Yamada, Teruhiko ; Tamamoto, Hideo ; FURUYA, KIYOSHI

  • Author_Institution
    Dept. of Electron. & Commun., Meiji Univ., Japan
  • Volume
    5
  • Issue
    5
  • fYear
    1988
  • Firstpage
    60
  • Lastpage
    79
  • Abstract
    Surveys recent research activities in test technology for computers, focusing on the results of university researchers. They cover test-pattern generation, fault simulation, design for testability, built-in self-test, and self-checking.<>
  • Keywords
    automatic testing; computer testing; fault tolerant computing; Japan; built-in self-test; computers; design for testability; fault simulation; research activities; self-checking; test technology; test-pattern generation; university researchers; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Design for testability; Electrical fault detection; Fault detection; Fault tolerance; Logic functions; Logic testing;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.7982
  • Filename
    7982
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1255775