• DocumentCode
    1256182
  • Title

    Amorphous silicon phototransistor as nonlinear optical device for high dynamic range imagers

  • Author

    Nascetti, Augusto ; Caputo, Domenico

  • Author_Institution
    Dept. of Electron. Eng., Rome Univ., Italy
  • Volume
    49
  • Issue
    3
  • fYear
    2002
  • fDate
    3/1/2002 12:00:00 AM
  • Firstpage
    395
  • Lastpage
    399
  • Abstract
    An amorphous silicon bulk barrier phototransistor is studied as a basic element for the pixel of high dynamic photosensor arrays. The device is an n-i-δp-i-n structure whose optical gain shows a nonlinear dependence on the illumination intensity. For each applied bias voltage, a quasi-hyperbolic decrease of the optical gain as a function of the incident power is found. This behavior can be explained taking into account both the material characteristics (defect distribution, dopant concentration), and the structure properties. Our measurements lead to a minimum detectable signal of about 0.7 nW/cm2 independently on the applied voltage, making the device suitable for low illumination conditions. On the other hand, by increasing the input power up to 35 mW/cm2, we did not find saturation of output photocurrent leading to a dynamic range of at least of 120 dB. This value can be further increased by using as basic cell of the pixel the phototransistor and a resistor connected between the voltage supply and the collector electrode
  • Keywords
    amorphous semiconductors; elemental semiconductors; hydrogen; image sensors; nonlinear optics; phototransistors; silicon; Si:H; amorphous silicon phototransistor; bulk barrier phototransistor; current-voltage characterization; defect distribution; dopant concentration; high dynamic photosensor arrays; high dynamic range imagers; illumination intensity dependence; minimum detectable signal; n-i-δp-i-n stacked structure; nonlinear optical device; operating bias condition; Amorphous silicon; Lighting; Nonlinear optical devices; Nonlinear optics; Optical devices; Optical materials; Optical saturation; Phototransistors; Signal detection; Voltage;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.987108
  • Filename
    987108