DocumentCode
1256470
Title
Simple determination of BJT extrinsic base resistance
Author
Zimmer, T. ; Meresse, A. ; Dom, J.P.
Author_Institution
IXL, ENSERB-Univ. de Bordeaux I, Talence, France
Volume
27
Issue
21
fYear
1991
Firstpage
1895
Lastpage
1896
Abstract
The extrinsic base resistance of a bipolar transistor can be evaluated by measuring the base voltage in addition to the open-circuited junction voltage. Experimental results demonstrate the efficiency of this technique.
Keywords
bipolar transistors; electric resistance measurement; semiconductor device testing; base voltage measurement; bipolar transistor; extrinsic base resistance; open-circuited junction voltage;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19911176
Filename
98832
Link To Document