• DocumentCode
    1256513
  • Title

    Photovoltaic gate biasing edge effect in GaAs MESFETs

  • Author

    Abbott, Derek ; Cui, Shuguang ; Eshraghian, K.

  • Author_Institution
    Centre for Gallium Arsenide VLSI Technol., Adelaide Univ., SA, Australia
  • Volume
    27
  • Issue
    21
  • fYear
    1991
  • Firstpage
    1900
  • Lastpage
    1902
  • Abstract
    A new effect in planar GaAs MESFETs, whereby a sharp increase in optical gain at the transistor edges occurs, is reported for the first time. This gain effect only appears when a large resistor is inserted in series with the gate, to produce the conditions for photovoltaic gate biasing. The mechanism for increased gain at the edges is suggested to be due to carrier photogeneration in the substrate that is subsequently collected by the gate. Application in the area of X-Y addressable transistor array imagers is proposed.
  • Keywords
    III-V semiconductors; Schottky gate field effect transistors; gallium arsenide; image sensors; photovoltaic effects; GaAs; MESFETs; X-Y addressable transistor array imagers; carrier photogeneration; optical gain; photovoltaic gate biasing; planar device; transistor edges;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19911180
  • Filename
    98836