Title :
Improved Off-State Reliability of Nonvolatile Resistive Switch With Low Programming Voltage
Author :
Tada, Mitsunori ; Sakamoto, Takanori ; Miyamura, Makoto ; Banno, N. ; Okamoto, K. ; Iguchi, Noriyuki ; Hada, Hiromitsu
Author_Institution :
Low-power Electronics Association & Project (LEAP), Tsukuba, Japan
Abstract :
A complementary atom switch (CAS) is proposed to realize low programming voltage and high off-state reliability for crossbar switch application. Two atom switches with bipolar operation are connected in series with opposite direction, in which the two atom switches work as a single element. The two off-state atom switches in the CAS complementarily divide voltage stress, greatly enlarging the off-state lifetime. The CAS is embedded in Cu BEOL on a 65-nm-node CMOS platform without degrading the CMOS and interconnect performances. The CAS using two atom switches is one of the candidates for realizing energy-efficient nonvolatile programmable switches.
Keywords :
CMOS integrated circuits; Programming; Reliability; Resistance; Switching circuits; Crossbar switch; PLD; field-programmable gate array (FPGA); nonvolatile memory; polymer; reconfigurable logic; solid electrolyte; switch;
Journal_Title :
Electron Devices, IEEE Transactions on
DOI :
10.1109/TED.2012.2204263
