Title :
Direct-sequence spread-spectrum multiple-access communications with random signature sequences: a large deviations analysis
Author :
Sadowsky, John S. ; Bahr, Randall K.
Author_Institution :
Sch. of Electr. Eng., Purdue Univ., West Lafayette, IN, USA
fDate :
5/1/1991 12:00:00 AM
Abstract :
A direct-sequence spread-spectrum multiple-access bit-error probability analysis is developed using large-deviations theory. Let m denote the number of interfering spread-spectrum signals and let n denote the signature sequence length. Then the large deviations limit is as n to infinity with m fixed. A tight asymptotic expression for the bit-error probability is proven, and in addition, recent large-deviations results with the importance sampling Monte Carlo estimation technique are applied to obtain accurate and computationally efficient estimates of the bit-error probability for finite values of m and n. The large-deviations point of view is compared also to the conventional asymptotics of central limit theory and the associated Gaussian approximation. The Gaussian approximation is accurate and the ratio m/n is moderately large and all signals have roughly equal power. In the near/far situation, however, the Gaussian approximation is quite poor. In contrast, large-deviations techniques are more accurate in the near/far situation, and it is here that these methods provide some important practical insight.
Keywords :
Monte Carlo methods; error statistics; multi-access systems; spread spectrum communication; DS-SSMA communications; Gaussian approximation; Monte Carlo estimation; bit-error probability; central limit theory; direct-sequence spread-spectrum multiple-access; importance sampling; interference; large deviations analysis; near/far situation; random signature sequences; Additive noise; Communication systems; Computer errors; Correlators; Delay effects; Gaussian approximation; Information theory; Monte Carlo methods; Multiple access interference; Spread spectrum communication;
Journal_Title :
Information Theory, IEEE Transactions on