The anti-reflection lens: Quantitatively far-field imaging beyond the Rayleigh limit

This study reports an novel approach to reconstruct quantitatively the electrical parameters of imaged specimen with sub-wavelength resolution. This super-resolution imaging methodology relies on the use of anti-reflection lens with the property of zero (strictly, approximately zero) backward propagation. We demonstrate theoretically and numerically that the anti-reflection lenses can encode the subtle information of imaged specimen into far field, and thus support the quantitative reconstruction of probed objects in the sub-wavelength resolution from far-field measurements merely by solving a well-conditioned linear inverse problem. The proposed approach is not only confined to weakly- but also suitable for generally- scattering cases. The operational principle of constructing the anti-reflection lens that is achievable with current experimental technique is provided as well. This new approach will be a breakthrough in the spatio-temporal control of field (or light) with the potential of being applied in nanolithography, detection, sensing or sub-wavelength imaging in the near future.