• DocumentCode
    1256944
  • Title

    On the capacity of the noisy runlength channel

  • Author

    Heegard, Chris D. ; Duel-Hallan, A. ; Krishnamoorthy, Rajeev

  • Author_Institution
    Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
  • Volume
    37
  • Issue
    3
  • fYear
    1991
  • fDate
    5/1/1991 12:00:00 AM
  • Firstpage
    712
  • Lastpage
    720
  • Abstract
    The authors consider the model for runlength coded systems of P.H. Siegel (1982) that is based on peak or edge detection. The model does not attempt to account for failures of the qualifying circuit; it is assumed that every transition is successfully declared (i.e., no missing or false qualifiers). In this model it is the error in the estimate of the location of the transition that introduces uncertainty at the channel output. The model is motivated by the problem of pulse location in white Gaussian noise. Through a series of lemmas and theorems, bounds on the capacity of this model are obtained. These bounds are evaluated and used to suggest that improvements in storage capacity are possible through the use of codes with designed noise tolerance.
  • Keywords
    channel capacity; digital storage; encoding; white noise; channel capacity; codes; edge detection; model; noise tolerance; noisy runlength channel; peak detection; pulse location; runlength coded systems; storage capacity; white Gaussian noise; Circuits; Detectors; Helium; Magnetic noise; Modulation coding; Optical modulation; Optical noise; Optical pulses; Optical recording; Optical sensors;
  • fLanguage
    English
  • Journal_Title
    Information Theory, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9448
  • Type

    jour

  • DOI
    10.1109/18.79941
  • Filename
    79941