DocumentCode :
1256944
Title :
On the capacity of the noisy runlength channel
Author :
Heegard, Chris D. ; Duel-Hallan, A. ; Krishnamoorthy, Rajeev
Author_Institution :
Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
Volume :
37
Issue :
3
fYear :
1991
fDate :
5/1/1991 12:00:00 AM
Firstpage :
712
Lastpage :
720
Abstract :
The authors consider the model for runlength coded systems of P.H. Siegel (1982) that is based on peak or edge detection. The model does not attempt to account for failures of the qualifying circuit; it is assumed that every transition is successfully declared (i.e., no missing or false qualifiers). In this model it is the error in the estimate of the location of the transition that introduces uncertainty at the channel output. The model is motivated by the problem of pulse location in white Gaussian noise. Through a series of lemmas and theorems, bounds on the capacity of this model are obtained. These bounds are evaluated and used to suggest that improvements in storage capacity are possible through the use of codes with designed noise tolerance.
Keywords :
channel capacity; digital storage; encoding; white noise; channel capacity; codes; edge detection; model; noise tolerance; noisy runlength channel; peak detection; pulse location; runlength coded systems; storage capacity; white Gaussian noise; Circuits; Detectors; Helium; Magnetic noise; Modulation coding; Optical modulation; Optical noise; Optical pulses; Optical recording; Optical sensors;
fLanguage :
English
Journal_Title :
Information Theory, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9448
Type :
jour
DOI :
10.1109/18.79941
Filename :
79941
Link To Document :
بازگشت