DocumentCode
1256944
Title
On the capacity of the noisy runlength channel
Author
Heegard, Chris D. ; Duel-Hallan, A. ; Krishnamoorthy, Rajeev
Author_Institution
Sch. of Electr. Eng., Cornell Univ., Ithaca, NY, USA
Volume
37
Issue
3
fYear
1991
fDate
5/1/1991 12:00:00 AM
Firstpage
712
Lastpage
720
Abstract
The authors consider the model for runlength coded systems of P.H. Siegel (1982) that is based on peak or edge detection. The model does not attempt to account for failures of the qualifying circuit; it is assumed that every transition is successfully declared (i.e., no missing or false qualifiers). In this model it is the error in the estimate of the location of the transition that introduces uncertainty at the channel output. The model is motivated by the problem of pulse location in white Gaussian noise. Through a series of lemmas and theorems, bounds on the capacity of this model are obtained. These bounds are evaluated and used to suggest that improvements in storage capacity are possible through the use of codes with designed noise tolerance.
Keywords
channel capacity; digital storage; encoding; white noise; channel capacity; codes; edge detection; model; noise tolerance; noisy runlength channel; peak detection; pulse location; runlength coded systems; storage capacity; white Gaussian noise; Circuits; Detectors; Helium; Magnetic noise; Modulation coding; Optical modulation; Optical noise; Optical pulses; Optical recording; Optical sensors;
fLanguage
English
Journal_Title
Information Theory, IEEE Transactions on
Publisher
ieee
ISSN
0018-9448
Type
jour
DOI
10.1109/18.79941
Filename
79941
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