DocumentCode
1257182
Title
Influence of the gate internal impedance on losses in a power MOS transistor switching at a high frequency in the ZVS mode
Author
Lefebvre, Stéphane ; Costa, François ; Miserey, Francis
Author_Institution
Laboratoire d´´Electricite Signaux et Robotique, Cachan, France
Volume
17
Issue
1
fYear
2002
fDate
1/1/2002 12:00:00 AM
Firstpage
33
Lastpage
39
Abstract
In order to use a power metal oxide semiconductor (MOS) transistor switching in the zero voltage mode at high frequencies, the output capacitance has to be maximal and the input capacitance minimal. These characteristics are available in the datasheets. Nevertheless, to choose a transistor ideal for such an application, having minimal losses, additional characterizations have to be done in order to complete the datasheets. In particular, it is necessary to make sure that all the cells of the MOS transistor can be opened in a time shortly before the voltage rise time at turn-off, in order to reduce as low as possible the turn-off losses. The present paper points out that the gate to source impedance characterizes the ability of the device to turn-off very quickly and the knowledge of that parameter is useful to choose a MOS transistor having minimal losses in very high frequency zero voltage switching (ZVS) applications
Keywords
electric impedance; field effect transistor switches; loss measurement; losses; power MOSFET; power semiconductor switches; semiconductor device testing; ZVS; datasheets; gate internal impedance; gate to source impedance; input capacitance; internal gate characterization; losses; minimal losses; output capacitance; power MOS transistor switching; turn-off losses reduction; very high frequency zero voltage switching; voltage rise time; zero voltage switching; Capacitance; Choppers; Circuit testing; Electronic equipment testing; Impedance; MOSFETs; Power semiconductor switches; Switching frequency; Zero current switching; Zero voltage switching;
fLanguage
English
Journal_Title
Power Electronics, IEEE Transactions on
Publisher
ieee
ISSN
0885-8993
Type
jour
DOI
10.1109/63.988667
Filename
988667
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