• DocumentCode
    1257280
  • Title

    The flat strap sandwich shunt

  • Author

    Castelli, Franco

  • Author_Institution
    Dipt. di Elettrotecnica, Politecnico di Milano, Italy
  • Volume
    48
  • Issue
    5
  • fYear
    1999
  • fDate
    10/1/1999 12:00:00 AM
  • Firstpage
    894
  • Lastpage
    898
  • Abstract
    The basic principle of a new shunt, the “flat strap sandwich shunt” (FSSS), which consists of a shielded very thin (to 25 μm) flat strap resistor in the sandwich configuration, a folded flat strap resistor with many rolled together layers, and the proper four-terminal, is illustrated. With such a configuration the distribution of the current density on the strap´s section is evaluated to approach that of a theoretical isolated strap. Test results on two implementation prototypes of the FSSS show that both its response time, I2T and its frequency characteristic may be at least the same as the more advanced coaxial shunts. Moreover its construction appears much simpler and less expensive than that of the coaxial shunt. The use of the FSSS for measuring high-impulse and heavy-surge currents or continuous complex currents, as well as in thermal current converters and power transfer, is also illustrated
  • Keywords
    convertors; current density; electric current measurement; frequency response; resistors; transfer standards; 25 micron; coaxial shunts; continuous complex current measurement; current density distribution; flat strap sandwich shunt; folded flat strap resistor; four-terminal; frequency characteristic; frequency response; heavy-surge current measurement; high-impulse current measurement; implementation prototypes; power transfer; proximity effect; response time; rolled together layers; shielded very thin flat strap resistor; skin depth; thermal current converters; Circuits; Coaxial components; Current density; Current measurement; Delay; Proximity effect; Resistors; Skin effect; Testing; Thermal resistance;
  • fLanguage
    English
  • Journal_Title
    Instrumentation and Measurement, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9456
  • Type

    jour

  • DOI
    10.1109/19.799642
  • Filename
    799642