DocumentCode :
1257305
Title :
Timing characteristics of a Cd1-xZnxTe detector-based X-ray imaging system
Author :
Giakos, George C. ; Vedantham, S. ; Chowdhury, S. ; Odogba, J. ; Dasgupta, A. ; Guntupalli, R. ; Suryanarayanan, S. ; Vega-Lozada, V. ; Sridhar, M. ; Khyati, M. ; Shah, N.
Author_Institution :
Dept. of Biomed. Eng., Akron Univ., OH, USA
Volume :
48
Issue :
5
fYear :
1999
fDate :
10/1/1999 12:00:00 AM
Firstpage :
909
Lastpage :
914
Abstract :
The timing characteristics of a planar Cd1-xZnx Te sample at each frequency of a scanning square-wave test pattern, has been measured. This study is aimed at evaluating the speed characteristics of a Cd1-xZnxTe detector for X-ray imaging and computed tomographic (CT) applications. The experimental results of this study indicate that the temporal response of a Cd1-xZnxTe detector based X-ray system, improves significantly by optimizing the X-ray tube and detector parameters
Keywords :
II-VI semiconductors; X-ray detection; biomedical equipment; cadmium compounds; computerised tomography; diagnostic radiography; image sensors; optical transfer function; semiconductor counters; zinc compounds; Cd1-xZnxTe detector-based; CdZnTe; X-ray imaging system; computed tomographic applications; digital radiography; optimized X-ray tube parameters; optimized detector parameters; scanning square-wave test pattern; temporal response; timing MTF; timing characteristics; Computer applications; Frequency measurement; Tellurium; Testing; Timing; Tomography; X-ray detection; X-ray detectors; X-ray imaging; Zinc;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.799646
Filename :
799646
Link To Document :
بازگشت