A new robust method for six-port reflectometer calibration

Author

Wiedmann, Frank ; Huyart, Bernard ; Bergeault, Eric ; Jallet, Louis

Author_Institution

Texas Instrum. Deutschland GmbH, Freising, Germany

Volume

48

Issue

5

fYear

1999

fDate

10/1/1999 12:00:00 AM

Firstpage

927

Lastpage

931

Abstract

A new robust method for finding the parameters of Engen´s six-port-to-four-port reduction algorithm for six-port reflectometer calibration has been developed. Like other previously published methods, it uses a minimum of five loads with an unknown but constant absolute value of the reflection coefficient and unknown but well-distributed phases. However, the quality of the parameter estimates is improved, especially in noisy environments, by efficiently eliminating cases in which these earlier methods may become ill-conditioned. The new method has been used successfully to calibrate a newly developed six-port reflectometer in GaAs MMIC technology working between 1.3 GHz and 3.0 GHz

Keywords

III-V semiconductors; MMIC; S-parameters; calibration; gallium arsenide; microwave reflectometry; multiport networks; network analysers; 1.3 to 3.0 GHz; Engen´s six-port-to-four-port reduction algorithm; GaAs; MMIC technology; parameter estimates; reflection coefficient; robust method; six-port reflectometer calibration; well-distributed phases; Acoustic reflection; Calibration; Gallium arsenide; MMICs; Meter reading; Parameter estimation; Power measurement; Robustness; Testing; Working environment noise;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.799649

Filename

799649