DocumentCode :
1257324
Title :
A new robust method for six-port reflectometer calibration
Author :
Wiedmann, Frank ; Huyart, Bernard ; Bergeault, Eric ; Jallet, Louis
Author_Institution :
Texas Instrum. Deutschland GmbH, Freising, Germany
Volume :
48
Issue :
5
fYear :
1999
fDate :
10/1/1999 12:00:00 AM
Firstpage :
927
Lastpage :
931
Abstract :
A new robust method for finding the parameters of Engen´s six-port-to-four-port reduction algorithm for six-port reflectometer calibration has been developed. Like other previously published methods, it uses a minimum of five loads with an unknown but constant absolute value of the reflection coefficient and unknown but well-distributed phases. However, the quality of the parameter estimates is improved, especially in noisy environments, by efficiently eliminating cases in which these earlier methods may become ill-conditioned. The new method has been used successfully to calibrate a newly developed six-port reflectometer in GaAs MMIC technology working between 1.3 GHz and 3.0 GHz
Keywords :
III-V semiconductors; MMIC; S-parameters; calibration; gallium arsenide; microwave reflectometry; multiport networks; network analysers; 1.3 to 3.0 GHz; Engen´s six-port-to-four-port reduction algorithm; GaAs; MMIC technology; parameter estimates; reflection coefficient; robust method; six-port reflectometer calibration; well-distributed phases; Acoustic reflection; Calibration; Gallium arsenide; MMICs; Meter reading; Parameter estimation; Power measurement; Robustness; Testing; Working environment noise;
fLanguage :
English
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9456
Type :
jour
DOI :
10.1109/19.799649
Filename :
799649
Link To Document :
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