Title :
Using artificial neural networks or Lagrange interpolation to characterize the faults in an analog circuit: an experimental study
Author :
Maiden, Y. ; Jervis, Barrie W. ; Fouillat, Pascal ; Lesage, S.
Author_Institution :
Bordeaux I Univ., Talence, France
fDate :
10/1/1999 12:00:00 AM
Abstract :
A technique for diagnosing multiple faults in analog circuits from their impulse response function using a fault dictionary was developed. Dirac impulse input to the circuit was simulated and time domain features of the output response were used to build the dictionary. The test of a real circuit by means of a fault dictionary gives realistic results provided the simulated and measured values are similar. Consequently, the choice of the model used in the simulation is important. The precautions to realize the measurement are described
Keywords :
analogue integrated circuits; fault diagnosis; integrated circuit testing; interpolation; neural nets; time-domain analysis; Dirac impulse input; Lagrange interpolation; analog circuit; artificial neural networks; fault dictionary; impulse response function; multiple fault diagnosis; output response; time domain features; Artificial neural networks; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Intelligent networks; Interpolation; Lagrangian functions; Time factors; Voltage;
Journal_Title :
Instrumentation and Measurement, IEEE Transactions on