DocumentCode
125734
Title
Perturbation analysis of the TE plane wave scattering from the end-face of a waveguide system
Author
Komiyama, Akira
Author_Institution
Osaka Electro-Commun. Univ., Neyagawa, Japan
fYear
2014
fDate
16-23 Aug. 2014
Firstpage
1
Lastpage
4
Abstract
The scattering of TE plane wave from the end-face of a two-dimensional waveguide system is treated by solving straightforwardly a wave equation for the electric field. The unknown scattered field is expanded into a perturbation series with respect to the difference of refractive indices of core and cladding. The first and second order terms of the series are analytically derived and it is shown that the second order term is sufficiently small compared with the first order term and can be ignored.
Keywords
electric fields; electromagnetic wave scattering; perturbation techniques; refractive index; waveguides; TE plane wave scattering; electric field; end face; perturbation analysis; refractive indices; two dimensional waveguide system; unknown scattered field; wave equation; Dielectrics; Integral equations; Laser beams; Optical waveguides; Planar waveguides; Scattering;
fLanguage
English
Publisher
ieee
Conference_Titel
General Assembly and Scientific Symposium (URSI GASS), 2014 XXXIth URSI
Conference_Location
Beijing
Type
conf
DOI
10.1109/URSIGASS.2014.6929099
Filename
6929099
Link To Document