DocumentCode :
125734
Title :
Perturbation analysis of the TE plane wave scattering from the end-face of a waveguide system
Author :
Komiyama, Akira
Author_Institution :
Osaka Electro-Commun. Univ., Neyagawa, Japan
fYear :
2014
fDate :
16-23 Aug. 2014
Firstpage :
1
Lastpage :
4
Abstract :
The scattering of TE plane wave from the end-face of a two-dimensional waveguide system is treated by solving straightforwardly a wave equation for the electric field. The unknown scattered field is expanded into a perturbation series with respect to the difference of refractive indices of core and cladding. The first and second order terms of the series are analytically derived and it is shown that the second order term is sufficiently small compared with the first order term and can be ignored.
Keywords :
electric fields; electromagnetic wave scattering; perturbation techniques; refractive index; waveguides; TE plane wave scattering; electric field; end face; perturbation analysis; refractive indices; two dimensional waveguide system; unknown scattered field; wave equation; Dielectrics; Integral equations; Laser beams; Optical waveguides; Planar waveguides; Scattering;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
General Assembly and Scientific Symposium (URSI GASS), 2014 XXXIth URSI
Conference_Location :
Beijing
Type :
conf
DOI :
10.1109/URSIGASS.2014.6929099
Filename :
6929099
Link To Document :
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