A fast low-cost solar cell spectral response measurement system with accuracy indicator

Author

Silvestre, S. ; Sentís, L. ; Castañer, L.

Author_Institution

Dept. of Electron. Eng., Univ. Politecnica de Catalunya, Barcelona, Spain

Volume

48

Issue

5

fYear

1999

fDate

10/1/1999 12:00:00 AM

Firstpage

944

Lastpage

948

Abstract

A novel automated spectral measurement system is presented. Special attention has been focused on the design in order to obtain rapid measurement facilities, minimize hardware and simplify serial communications between the different subsystems involved, resulting in a low-cost measurement system. It is controlled by an HP-9000 computer, through a fully menu-driven interface, and the primary measurement instrument is an HP-4142B modular source-monitor. A new indicator of measurement accuracy is defined, implemented and displayed in real time. This automated system has been employed intensively to study characteristics of different solar cell types in order to optimize their fabrication process. As such this automated measurement system is clearly useful for both research and fabrication

Keywords

automatic testing; semiconductor device measurement; semiconductor device testing; solar cells; spectral analysers; HP-4142B modular source-monitor; fabrication process; measurement accuracy; measurement facilities; primary measurement instrument; serial communications; solar cell; spectral response measurement system; Automatic control; Circuit testing; Current measurement; Fabrication; Filters; Hardware; Light sources; Photovoltaic cells; Short circuit currents; Wavelength measurement;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.799652

Filename

799652