Influence of the architecture on ADC error modeling

Author

Arpaia, Pasquale ; Daponte, Pasquale ; Michaeli, Linus

Author_Institution

Dipt. di Ingegneria Elettrica, Naples Univ., Italy

Volume

48

Issue

5

fYear

1999

fDate

10/1/1999 12:00:00 AM

Firstpage

956

Lastpage

966

Abstract

The influence of the architecture on analog-to-digital converter modeling is investigated for the three most widespread architectures: integrating, successive approximations, and flash. The effects of main error sources are analyzed in terms of integral and differential nonlinearity with the aim of setting up a unified error model. Such a model is useful both to economically generate a look-up table for error correction and to quickly produce diagnosis models for fault detection and isolation. Numerical simulations aimed to show the model effectiveness and experimental tests carried out to validate the model are discussed

Keywords

analogue-digital conversion; error analysis; error correction; fault diagnosis; integrated circuit modelling; table lookup; ADC error modeling; diagnosis models; differential nonlinearity; error correction; error sources; fault detection; fault isolation; flash ADC; integral nonlinearity; integrating ADC; look-up table; successive approximations; unified error model; Analog-digital conversion; Circuit faults; Computer architecture; Distortion measurement; Error analysis; Error correction; Integrated circuit measurements; Numerical simulation; Proposals; Table lookup;

fLanguage

English

Journal_Title

Instrumentation and Measurement, IEEE Transactions on

Publisher

ieee

ISSN

0018-9456

Type

jour

DOI

10.1109/19.799654

Filename

799654