• DocumentCode
    1257517
  • Title

    Transduction of High-Frequency Micromechanical Resonators Using Depletion Forces in p-n Diodes

  • Author

    Hwang, Eugene ; Bhave, Sunil A.

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
  • Volume
    58
  • Issue
    8
  • fYear
    2011
  • Firstpage
    2770
  • Lastpage
    2776
  • Abstract
    We present in this paper the design and fabrication of a homogeneous silicon micromechanical resonator actuated using forces acting on the immobile charge in the depletion region of a symmetrically doped p-n diode. The proposed resonator combines the high quality factor Q of air-gap-transduced resonators with the frequency-scaling benefits of internal dielectrically transduced resonators. Using this transduction method, we demonstrate a thickness-longitudinal-mode micromechanical resonator with Q~18000 at a resonant frequency of 3.72 GHz at room temperature, yielding an f ·Q product of 6.69 × 1013 Hz, which is the highest reported value for a silicon micromechanical resonator to date.
  • Keywords
    Q-factor; elemental semiconductors; micromechanical resonators; p-i-n diodes; silicon; Q factor; Si; air-gap-transduced resonator; depletion forces; frequency 3.72 GHz; frequency-scaling; high-frequency micromechanical resonators; internal dielectrically transduced resonators; quality factor; symmetrically doped p-n diode; temperature 293 K to 298 K; transduction method; Capacitance; Doping; Force; Junctions; Resonant frequency; Silicon; Strain; Micromechanical resonators; p-n diode; quality factor $(Q)$; radio-frequency microelectromechanical systems (RF MEMS);
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2158103
  • Filename
    5929546